Combining Drive Tests and Automatically Tuned Propagation Models in the Construction of Path Loss Grids

Daniel Fernandes, Lucio Studer Ferreira, Mohammad Nozari, Pedro Sebastiao, Francisco Cercas, Rui Dinis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

The constant need of operators to ensure a high quality of service requires an adequate estimation of signal level in the service area. Drive Tests (DTs) are used to monitor signal level. Still this is an expensive task, not being able to cover all areas. A methodology to build complete path loss grids for a given site is proposed. Starting from available DTs measurements for certain pixels, path loss is estimated for the remaining ones by tuning a propagation model and extrapolating the path loss for neighboring pixels. This allows to provide a complete path loss estimation for the desired area around the cell.

Original languageEnglish
Title of host publication2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1161-1162
Number of pages2
Volume2018-September
ISBN (Electronic)9781538660096
DOIs
Publication statusPublished - 18 Dec 2018
Event29th IEEE Annual International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC 2018 - Bologna, Italy
Duration: 9 Sep 201812 Sep 2018

Conference

Conference29th IEEE Annual International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC 2018
CountryItaly
CityBologna
Period9/09/1812/09/18

Keywords

  • Drive Tests
  • Path Loss
  • Propagation Models

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    Fernandes, D., Ferreira, L. S., Nozari, M., Sebastiao, P., Cercas, F., & Dinis, R. (2018). Combining Drive Tests and Automatically Tuned Propagation Models in the Construction of Path Loss Grids. In 2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC 2018 (Vol. 2018-September, pp. 1161-1162). [8580708] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PIMRC.2018.8580708