Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

Alexander Tolstogouzov, Mikhail N. Drozdov, Sergey F. Belykh, Gennady P. Gololobov, Alexei E. Ieshkin, Paul Mazarov, Dmitriy V. Suvorov, Dejun Fu, Vasiliy Pelenovich, Xiaomei Zeng, Wenbin Zuo

Research output: Contribution to journalLetter

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)323-325
Number of pages3
JournalRapid Communications in Mass Spectrometry
Volume33
Issue number3
DOIs
Publication statusPublished - 15 Feb 2019

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