Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

Alexander Tolstogouzov; Mikhail N. Drozdov; Sergey F. Belykh; Gennady P. Gololobov; Alexei E. Ieshkin; Paul Mazarov; Dmitriy V. Suvorov; Dejun Fu; Vasiliy Pelenovich; Xiaomei Zeng; Wenbin Zuo

doi:10.1002/rcm.8345

Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

Alexander Tolstogouzov, Mikhail N. Drozdov, Sergey F. Belykh, Gennady P. Gololobov, Alexei E. Ieshkin, Paul Mazarov, Dmitriy V. Suvorov, Dejun Fu, Vasiliy Pelenovich, Xiaomei Zeng, Wenbin Zuo

Research output: Contribution to journal › Letter › peer-review

3 Citations (Scopus)

Original language	English
Pages (from-to)	323-325
Number of pages	3
Journal	Rapid Communications in Mass Spectrometry
Volume	33
Issue number	3
DOIs	https://doi.org/10.1002/rcm.8345
Publication status	Published - 15 Feb 2019

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10.1002/rcm.8345Licence: CC BY-NC

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@article{3440de5b84d842dfb1f3eb794410d5e2,

title = "Cluster secondary ion emission of silicon: An influence of the samples' dimensional features",

author = "Alexander Tolstogouzov and Drozdov, {Mikhail N.} and Belykh, {Sergey F.} and Gololobov, {Gennady P.} and Ieshkin, {Alexei E.} and Paul Mazarov and Suvorov, {Dmitriy V.} and Dejun Fu and Vasiliy Pelenovich and Xiaomei Zeng and Wenbin Zuo",

note = "This work was partly supported by the Ministry of Education and Science of the Russian Federation (Project Nos. 11.9686.2017/8/9 and 8.2810.2017), by the Russian Foundation for Basic Research (Contract No. 18-02-00565), and by the National Natural Science Foundation of China (Grant No. 11875210). Equipment from the Centre of Physics and Technology of Micro- and Nanostructures at IPM RAS was employed in this work.",

year = "2019",

month = feb,

day = "15",

doi = "10.1002/rcm.8345",

language = "English",

volume = "33",

pages = "323--325",

journal = "Rapid Communications in Mass Spectrometry",

issn = "0951-4198",

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TY - JOUR

T1 - Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

AU - Tolstogouzov, Alexander

AU - Drozdov, Mikhail N.

AU - Belykh, Sergey F.

AU - Gololobov, Gennady P.

AU - Ieshkin, Alexei E.

AU - Mazarov, Paul

AU - Suvorov, Dmitriy V.

AU - Fu, Dejun

AU - Pelenovich, Vasiliy

AU - Zeng, Xiaomei

AU - Zuo, Wenbin

N1 - This work was partly supported by the Ministry of Education and Science of the Russian Federation (Project Nos. 11.9686.2017/8/9 and 8.2810.2017), by the Russian Foundation for Basic Research (Contract No. 18-02-00565), and by the National Natural Science Foundation of China (Grant No. 11875210). Equipment from the Centre of Physics and Technology of Micro- and Nanostructures at IPM RAS was employed in this work.

PY - 2019/2/15

Y1 - 2019/2/15

UR - http://www.scopus.com/inward/record.url?scp=85060157870&partnerID=8YFLogxK

U2 - 10.1002/rcm.8345

DO - 10.1002/rcm.8345

M3 - Letter

C2 - 30408251

AN - SCOPUS:85060157870

VL - 33

SP - 323

EP - 325

JO - Rapid Communications in Mass Spectrometry

JF - Rapid Communications in Mass Spectrometry

SN - 0951-4198

IS - 3

ER -

Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

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