TY - JOUR
T1 - Charging effects and surface potential variations of Cu-based nanowires
AU - Gomes, Daniela da Silva Nunes
AU - Calmeiro, Tomas R.
AU - Nandy, Suman
AU - Sarmento, Joana Maria Doria Vaz Pinto Morais
AU - Pimentel, Ana Cláudia Madeira Botas Gomes
AU - Barquinha, Pedro Miguel Cândido
AU - Fortunato, Elvira Maria Correia
AU - Martins, Rodrigo Ferrão de Paiva
N1 - sem pdf conforme despacho
PY - 2016/2/29
Y1 - 2016/2/29
N2 - The present work reports charging effects and surface potential variations in pure copper, cuprous oxide and cupric oxide nanowires observed by electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM). The copper nanowires were produced by wet synthesis, oxidation into cuprous oxide nanowires was achieved through microwave irradiation and cupric oxide nanowires were obtained via furnace annealing in atmospheric conditions. Structural characterization of the nanowires was carried out by X-ray diffraction, scanning electron microscopy, transmission electron microscopy and energy dispersive X-ray spectroscopy. During the EFM experiments the electrostatic field of the positive probe charged negatively the Cu-based nanowires, which in turn polarized the SiO2 dielectric substrate. Both the probe/nanowire capacitance as well as the substrate polarization increased with the applied bias. Cu2O and CuO nanowires behaved distinctively during the EFM measurements in accordance with their band gap energies. The work functions (WF) of the Cu-based nanowires, obtained by KPFM measurements, yielded WFCuO > WFCu > WFCu2O.
AB - The present work reports charging effects and surface potential variations in pure copper, cuprous oxide and cupric oxide nanowires observed by electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM). The copper nanowires were produced by wet synthesis, oxidation into cuprous oxide nanowires was achieved through microwave irradiation and cupric oxide nanowires were obtained via furnace annealing in atmospheric conditions. Structural characterization of the nanowires was carried out by X-ray diffraction, scanning electron microscopy, transmission electron microscopy and energy dispersive X-ray spectroscopy. During the EFM experiments the electrostatic field of the positive probe charged negatively the Cu-based nanowires, which in turn polarized the SiO2 dielectric substrate. Both the probe/nanowire capacitance as well as the substrate polarization increased with the applied bias. Cu2O and CuO nanowires behaved distinctively during the EFM measurements in accordance with their band gap energies. The work functions (WF) of the Cu-based nanowires, obtained by KPFM measurements, yielded WFCuO > WFCu > WFCu2O.
KW - Cu-based nanowires
KW - Electrostatic force microscopy
KW - Kelvin probe force microscopy
KW - charge mapping
KW - Dielectric polarization
KW - Capacitive effects
UR - http://www.sciencedirect.com/science/article/pii/S0040609015012328
U2 - 10.1016/j.tsf.2015.11.077
DO - 10.1016/j.tsf.2015.11.077
M3 - Article
SN - 0040-6090
VL - 601
SP - 45
EP - 53
JO - Thin Solid Films
JF - Thin Solid Films
ER -