Characterization of TiAl alloys by secondary ion mass spectrometry

J. Barbosa, O. M. N. D. Teodoro, A. M. C. Moutinho, C. Silva Ribeiro, A. Caetano Monteiro

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

Titanium aluminides are arising as a valuable alternative to superalloys in applications where the ratio resistance/density is important. Together with excellent mechanical and corrosion properties at high temperatures, such characteristics are very attractive for applications in the aeronautical, aerospace and automotive industries. However, the current high selling price, due to high costs of production and raw materials and the need of very specific equipment, are limitative factors for further applications. With the end of the cold war, and the decrease of traditional markets of TiAl, the strategy to develop other applications, strongly depends on the decrease of production costs. An alternative to the present production routes might be the use of traditional casting techniques, by induction melting of the alloy in a ceramic crucible and pouring into ceramic moulds, made by the investment casting process. However, due to the high reactivity of Ti alloys, the use of traditional ceramic materials cannot be used, as they lead to oxide formation and oxygen pick up both from the crucible and the moulding materials. In this work, the relative oxygen concentration of Ti-48Al castings was measured by SIMS - Secondary Ion Mass Spectrometry. This technique provides a direct measurement of the isotopic composition with high sensitivity. The cylindrical samples were specially prepared to allow the analysis of the area close to the border. Oxygen profiles were acquired for samples obtained with different mould materials. The comparison of such profiles with hardness ones gives insight in the role of the oxygen concentration in the properties of the alloy and in the choice of the most suitable materials for TiAl production.

Original languageEnglish
Pages (from-to)653-656
Number of pages4
JournalMaterials Science Forum
Volume455-456
DOIs
Publication statusPublished - 28 Jul 2004
Event2nd International Materials Symposium - Caparica, Portugal
Duration: 14 Apr 200316 Apr 2003

Keywords

  • Induction melting
  • Investment casting
  • SIMS
  • Surface/interface analysis
  • TiAl

Fingerprint Dive into the research topics of 'Characterization of TiAl alloys by secondary ion mass spectrometry'. Together they form a unique fingerprint.

Cite this