Characterization of CdS-doped glass films obtained by pulsed laser deposition

C. R. Iordanescu (Stefan), M. Elisa, G. Epurescu, M. Filipescu, M. Enculescu, R. C. C. Monteiro, L. Constantin

Research output: Contribution to journalArticle

Abstract

In the present work we study the optical, struc-tural and morphological properties of CdS-doped glass films, deposited by Pulsed Laser Deposition (PLD) method. The glass target used for ablation was prepared by conventional melt-quenching technique and the semiconductor dopant, CdS powder, was embedded in the borosilicate melt glass host by continuous stirring. In order to improve the properties of the films, the laser wavelength was modified. Photoluminescence emission (PL) of CdSdoped glass films revealed a broad band located in the visible range. The structural analysis was carried out by micro-Raman spectroscopy, pointing out specific vibration modes for Si-O-Si bonds as well as for CdS dopant. The morphology and the chemical characterization of the films were investigated by Scanning Electron Microscopy (SEM), Energy Dispersive X-ray spectroscopy (EDX) and Atomic Force Microscopy (AFM).
Original languageEnglish
Pages (from-to)60-65
JournalRevista Romana de Materiale/ Romanian Journal of Materials
Volume47
Issue number1
Publication statusPublished - 2017

Keywords

  • borosilicate glass
  • thin film
  • pulsed laser deposition
  • luminescence
  • CdS-doped glass

Cite this

Iordanescu (Stefan), C. R., Elisa, M., Epurescu, G., Filipescu, M., Enculescu, M., Monteiro, R. C. C., & Constantin, L. (2017). Characterization of CdS-doped glass films obtained by pulsed laser deposition. Revista Romana de Materiale/ Romanian Journal of Materials, 47(1), 60-65.
Iordanescu (Stefan), C. R. ; Elisa, M. ; Epurescu, G. ; Filipescu, M. ; Enculescu, M. ; Monteiro, R. C. C. ; Constantin, L. / Characterization of CdS-doped glass films obtained by pulsed laser deposition. In: Revista Romana de Materiale/ Romanian Journal of Materials. 2017 ; Vol. 47, No. 1. pp. 60-65.
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abstract = "In the present work we study the optical, struc-tural and morphological properties of CdS-doped glass films, deposited by Pulsed Laser Deposition (PLD) method. The glass target used for ablation was prepared by conventional melt-quenching technique and the semiconductor dopant, CdS powder, was embedded in the borosilicate melt glass host by continuous stirring. In order to improve the properties of the films, the laser wavelength was modified. Photoluminescence emission (PL) of CdSdoped glass films revealed a broad band located in the visible range. The structural analysis was carried out by micro-Raman spectroscopy, pointing out specific vibration modes for Si-O-Si bonds as well as for CdS dopant. The morphology and the chemical characterization of the films were investigated by Scanning Electron Microscopy (SEM), Energy Dispersive X-ray spectroscopy (EDX) and Atomic Force Microscopy (AFM).",
keywords = "borosilicate glass, thin film, pulsed laser deposition, luminescence, CdS-doped glass",
author = "{Iordanescu (Stefan)}, {C. R.} and M. Elisa and G. Epurescu and M. Filipescu and M. Enculescu and Monteiro, {R. C. C.} and L. Constantin",
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Iordanescu (Stefan), CR, Elisa, M, Epurescu, G, Filipescu, M, Enculescu, M, Monteiro, RCC & Constantin, L 2017, 'Characterization of CdS-doped glass films obtained by pulsed laser deposition', Revista Romana de Materiale/ Romanian Journal of Materials, vol. 47, no. 1, pp. 60-65.

Characterization of CdS-doped glass films obtained by pulsed laser deposition. / Iordanescu (Stefan), C. R.; Elisa, M.; Epurescu, G.; Filipescu, M.; Enculescu, M.; Monteiro, R. C. C.; Constantin, L.

In: Revista Romana de Materiale/ Romanian Journal of Materials, Vol. 47, No. 1, 2017, p. 60-65.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Characterization of CdS-doped glass films obtained by pulsed laser deposition

AU - Iordanescu (Stefan), C. R.

AU - Elisa, M.

AU - Epurescu, G.

AU - Filipescu, M.

AU - Enculescu, M.

AU - Monteiro, R. C. C.

AU - Constantin, L.

N1 - sem pdf. Executive Unity for Financing of Higher Education, Research and Innovation, Romania, for the financial support in the frame of 51/2011 contract from Ideas Program and to Romanian National Authority for Scientific Research by Nucleu Project. No. PN 45N.

PY - 2017

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N2 - In the present work we study the optical, struc-tural and morphological properties of CdS-doped glass films, deposited by Pulsed Laser Deposition (PLD) method. The glass target used for ablation was prepared by conventional melt-quenching technique and the semiconductor dopant, CdS powder, was embedded in the borosilicate melt glass host by continuous stirring. In order to improve the properties of the films, the laser wavelength was modified. Photoluminescence emission (PL) of CdSdoped glass films revealed a broad band located in the visible range. The structural analysis was carried out by micro-Raman spectroscopy, pointing out specific vibration modes for Si-O-Si bonds as well as for CdS dopant. The morphology and the chemical characterization of the films were investigated by Scanning Electron Microscopy (SEM), Energy Dispersive X-ray spectroscopy (EDX) and Atomic Force Microscopy (AFM).

AB - In the present work we study the optical, struc-tural and morphological properties of CdS-doped glass films, deposited by Pulsed Laser Deposition (PLD) method. The glass target used for ablation was prepared by conventional melt-quenching technique and the semiconductor dopant, CdS powder, was embedded in the borosilicate melt glass host by continuous stirring. In order to improve the properties of the films, the laser wavelength was modified. Photoluminescence emission (PL) of CdSdoped glass films revealed a broad band located in the visible range. The structural analysis was carried out by micro-Raman spectroscopy, pointing out specific vibration modes for Si-O-Si bonds as well as for CdS dopant. The morphology and the chemical characterization of the films were investigated by Scanning Electron Microscopy (SEM), Energy Dispersive X-ray spectroscopy (EDX) and Atomic Force Microscopy (AFM).

KW - borosilicate glass

KW - thin film

KW - pulsed laser deposition

KW - luminescence

KW - CdS-doped glass

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JO - Revista Romana de Materiale/ Romanian Journal of Materials

JF - Revista Romana de Materiale/ Romanian Journal of Materials

SN - 1583-3186

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ER -