Characterization of a barium surface by AES, XPS and SIMS

O. M. N. D. Teodoro; A. M. C. Moutinho

doi:10.1016/S0042-207X(01)00344-X

Characterization of a barium surface by AES, XPS and SIMS

O. M. N. D. Teodoro, A. M. C. Moutinho

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Abstract

The surface of a solid barium sample has been studied by surface analysis techniques. The procedure to obtain a clean surface is discussed. In depth distribution of the sputtered ions during cleaning provides a good way to understand the evolution in the surface composition. Ion images show clear differences in the composition of the sputtered spot relatively to the adjacent area. The acquisition of XPS and AES spectra showed that the surface is clean according to usual guidelines. However, positive and negative SIMS spectra gave insight in the identification of the low level contaminants. About 12 compounds have been identified on the 'clean' barium surface.

Original language	English
Pages (from-to)	431-437
Number of pages	7
Journal	Vacuum
Volume	64
Issue number	3-4
DOIs	https://doi.org/10.1016/S0042-207X(01)00344-X
Publication status	Published - 1 Jan 2002

Keywords

AES
Barium
SIMS
XPS

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10.1016/S0042-207X(01)00344-XLicence: CC BY-NC-ND

Characterization of a barium surfaceAccepted author manuscript, 902 KBLicence: CC BY-NC-ND

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title = "Characterization of a barium surface by AES, XPS and SIMS",

abstract = "The surface of a solid barium sample has been studied by surface analysis techniques. The procedure to obtain a clean surface is discussed. In depth distribution of the sputtered ions during cleaning provides a good way to understand the evolution in the surface composition. Ion images show clear differences in the composition of the sputtered spot relatively to the adjacent area. The acquisition of XPS and AES spectra showed that the surface is clean according to usual guidelines. However, positive and negative SIMS spectra gave insight in the identification of the low level contaminants. About 12 compounds have been identified on the 'clean' barium surface.",

keywords = "AES, Barium, SIMS, XPS",

author = "Teodoro, {O. M. N. D.} and Moutinho, {A. M. C.}",

note = "This work was supported by the Portuguese Foundation for Science and Technology through the project “An{\'a}lise de Superf{\'ı}cies” Ref. 3/3.1/MMA/1764/95.",

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T1 - Characterization of a barium surface by AES, XPS and SIMS

AU - Teodoro, O. M. N. D.

AU - Moutinho, A. M. C.

N1 - This work was supported by the Portuguese Foundation for Science and Technology through the project “Análise de Superfı́cies” Ref. 3/3.1/MMA/1764/95.

PY - 2002/1/1

Y1 - 2002/1/1

N2 - The surface of a solid barium sample has been studied by surface analysis techniques. The procedure to obtain a clean surface is discussed. In depth distribution of the sputtered ions during cleaning provides a good way to understand the evolution in the surface composition. Ion images show clear differences in the composition of the sputtered spot relatively to the adjacent area. The acquisition of XPS and AES spectra showed that the surface is clean according to usual guidelines. However, positive and negative SIMS spectra gave insight in the identification of the low level contaminants. About 12 compounds have been identified on the 'clean' barium surface.

AB - The surface of a solid barium sample has been studied by surface analysis techniques. The procedure to obtain a clean surface is discussed. In depth distribution of the sputtered ions during cleaning provides a good way to understand the evolution in the surface composition. Ion images show clear differences in the composition of the sputtered spot relatively to the adjacent area. The acquisition of XPS and AES spectra showed that the surface is clean according to usual guidelines. However, positive and negative SIMS spectra gave insight in the identification of the low level contaminants. About 12 compounds have been identified on the 'clean' barium surface.

KW - AES

KW - Barium

KW - SIMS

KW - XPS

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U2 - 10.1016/S0042-207X(01)00344-X

DO - 10.1016/S0042-207X(01)00344-X

M3 - Article

AN - SCOPUS:0036134740

SN - 0042-207X

VL - 64

SP - 431

EP - 437

JO - Vacuum

JF - Vacuum

IS - 3-4

ER -

Characterization of a barium surface by AES, XPS and SIMS

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