TY - JOUR
T1 - Built-in self test of high speed analog-to-digital converters
AU - Santin, Edinei
AU - Oliveira, Luis B.
AU - Goes, João
PY - 2019/12/1
Y1 - 2019/12/1
N2 - Signals found in nature need to be converted to the digital domain through analog-to-digital converters (ADCs) to be processed by digital means [1]. For applications in communication and measurement [2], [3], high conversion rates are required. With advances of the complementary metal oxide semiconductor (CMOS) technology, the conversion rates of CMOS ADCs are now well beyond the gigasamples per second (GS/s) range, but only moderate resolutions are required [4]. These ADCs need to be tested after fabrication and, if possible, during field operation. The test costs are a very significant fraction of their production cost [5]. This is mainly due to lengthy use of very expensive automated test equipment (ATE) to apply specific test stimuli to the devices under test (DUT) and to collect and analyze their responses.
AB - Signals found in nature need to be converted to the digital domain through analog-to-digital converters (ADCs) to be processed by digital means [1]. For applications in communication and measurement [2], [3], high conversion rates are required. With advances of the complementary metal oxide semiconductor (CMOS) technology, the conversion rates of CMOS ADCs are now well beyond the gigasamples per second (GS/s) range, but only moderate resolutions are required [4]. These ADCs need to be tested after fabrication and, if possible, during field operation. The test costs are a very significant fraction of their production cost [5]. This is mainly due to lengthy use of very expensive automated test equipment (ATE) to apply specific test stimuli to the devices under test (DUT) and to collect and analyze their responses.
UR - http://www.scopus.com/inward/record.url?scp=85075971603&partnerID=8YFLogxK
U2 - 10.1109/MIM.2019.8917897
DO - 10.1109/MIM.2019.8917897
M3 - Article
AN - SCOPUS:85075971603
SN - 1094-6969
VL - 22
SP - 4
EP - 10
JO - IEEE Instrumentation and Measurement Magazine
JF - IEEE Instrumentation and Measurement Magazine
IS - 6
M1 - 8917897
ER -