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Abstract

Signals found in nature need to be converted to the digital domain through analog-to-digital converters (ADCs) to be processed by digital means [1]. For applications in communication and measurement [2], [3], high conversion rates are required. With advances of the complementary metal oxide semiconductor (CMOS) technology, the conversion rates of CMOS ADCs are now well beyond the gigasamples per second (GS/s) range, but only moderate resolutions are required [4]. These ADCs need to be tested after fabrication and, if possible, during field operation. The test costs are a very significant fraction of their production cost [5]. This is mainly due to lengthy use of very expensive automated test equipment (ATE) to apply specific test stimuli to the devices under test (DUT) and to collect and analyze their responses.

Original languageEnglish
Article number8917897
Pages (from-to)4-10
Number of pages7
JournalIEEE Instrumentation and Measurement Magazine
Volume22
Issue number6
DOIs
Publication statusPublished - 1 Dec 2019

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