Atomic Force Microscopy on Polyelectrolyte Adsorbed Layers

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The use of atomic force microscopy (AFM) to characterize the morphology of adsorbed polymer in layerby-layer (LBL) films is reviewed. The morphological properties are described in terms of the adsorption parameters and descriptions are made of surface growth theories employed to explain film morphology. Also mentioned are uses of AFM in measuring thickness in nanostructured films and in investigating photoinscribed surface-relief gratings on azobenzene-containing materials and patterned surfaces in LBL films.
Original languageEnglish
Title of host publicationCurrent Issues on Multidisciplinary Microscopy Research and Education
Editors Méndez-Vilas, L. Labajos-Broncano
Place of PublicationBadajoz, Spain
PublisherFormatex Research Centre
Pages224-241
Number of pages18
ISBN (Print)84-609-6605-4, 9788460966050
Publication statusPublished - 2004

Publication series

NameFORMATEX Microscopy Book Series
Number2

Keywords

  • roughness
  • optical relief grating
  • layer-by-layer films
  • self-assembly
  • polyelectrolytes
  • morphology
  • AFM
  • grain size
  • thickness measurement

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