Analysis of front contact heterojunction in a-Si: H one-dimensional position sensitive detectors

M. Topič, F. Smole, J. Furlan, E. Fortunato, R. Martins

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The influence of different transparent conducting oxides (TCO) on the transverse photoelectrical properties of one-dimensional position sensitive detectors based on p-i-n amorphous silicon structures was studied. For both SnO 2 and indium tin oxide, poor quality of the p layer was revealed by secondary ion mass spectroscopy measurements. Good agreement between experimental and simulation characteristics of TCO/p-i-n structure was additionally conditioned by a strong increase in defect states at the p layer surface which can be attributed to the reduction/ oxidation process at the TCO/p interface. However, the analysis showed that under reverse bias the spectral response of the p-i-n structure is not significantly affected by different TCO layers and conditions at the TCO/p heterojunction. Nevertheless, indium tin oxide is less appropriate for a front TCO layer due to the poor reverse dark current-voltage characteristic, i.e., higher leakage current component leading to lower signal to noise ratio.

Original languageEnglish
Pages (from-to)1377-1381
Number of pages5
JournalReview of Scientific Instruments
Volume68
Issue number3
Publication statusPublished - Mar 1997

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