Amorphous and microcrystalline silicon p-i-n optical speed sensors based on the flying spot technique

M. Vieira, A. Fantoni, S. Koynov, J. Cruz, A. Maçarico, R. Martins

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

From the flying spot technique (FST) the ambipolar diffusion length and the effective-lifetime of the carriers photogenerated by a moving light spot that strikes a p-i-n junction can be inferred. In this paper, those properties of a p-i-n junction are used together with an optical triangulation principle to determine the velocity of an object that is moving in the direction of a light source. The light reflected back from the object is analysed through an amorphous or a microcrystalline p-i-n structure. Its transient transverse photovoltage is dependent on the velocity of the object. A comparison between the performances of both kinds of devices is presented.

Original languageEnglish
Pages (from-to)1193-1197
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume198-200
Issue numberPART 2
DOIs
Publication statusPublished - 1 Jan 1996
Event16th International Conference on Amorphous Semiconductors - Science and Technology (ICAS 16) - Kobe, Japan
Duration: 4 Sep 19958 Sep 1995

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