AD-layer for spatial control of light induced degradation on pin devices

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In this work we report experimental results on light induced metastability of a-Si: H p.i.n. devices with different microscopic/macroscopic structures and we discuss them in terms of improved stability through spatial control of charged defects grown during light exposure. By placing a thin (few A) intrinsic layer (i) between both p/i and i/n a-Si: H interfaces we are able to reduce the effective degradation rate through spatial modification of the electric field profile in the device. The electronic transport and the stability changes that accompany the change in microstructure (R) and hydrogen content (CH) of the i- and i′-layer, were monitored throughout the entire light induced degradation process and compared with the corresponding μT product (for both carriers) inferred through steady state photoconductivity and Flying Spot Technique (FST) measurements. Results show that the degradation rate is a function of CH and R of both layers and can be correlated with the density of microvoids and di-hydride bonding. Since the i′-layers have a higher CH bonded mainly as SiF2 radicals (R≈0.4), they act as an hindrance to the growth of the defect, in the active region, generating "gettering centers" whose localisation and density are tailored in such a way that they will control spatially the electric field profile during light exposure. Preliminary results show improvements in film's stability when the interfacial layer is included. So future progress toward more stable and efficient a-Si: H solar cells will depend on a careful engineering design of the devices.

Original languageEnglish
Title of host publicationAmorphous Silicon Technology - 1994
Number of pages6
Publication statusPublished - 1994
Event1994 MRS Spring Meeting - San Francisco, CA, United States
Duration: 4 Apr 19948 Apr 1994


Conference1994 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA


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