Accurate determination of band tail properties in amorphous semiconductor thin film with Kelvin probe force microscopy

Luca Fabbri, Camilla Bordoni, Pedro Barquinha, Jerome Crocco, Beatrice Fraboni, Tobias Cramer

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)
50 Downloads (Pure)

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Engineering & Materials Science

Chemistry