A vacuum double-crystal spectrometer for reference-free X-ray spectroscopy of highly charged ions

P. Amaro, C. I. Szabo, S. Schlesser, A. Gumberidze, E. G. Kessler, A. Henins, E. O. Le Bigot, M. Trassinelli, J. M. Isac, P. Travers, M. Guerra, J. P. Santos, P. Indelicato

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We have built a vacuum double crystal spectrometer, which coupled to an electron-cyclotron resonance ion source, allows absolute measurements of low-energy X-ray transitions in highly charged ions with accuracies of the order of a few parts per million. We describe in detail the instrument and its performance. Furthermore, we present a few spectra of n = 2 → n = 1 transitions in Ar14+, Ar15+ and Ar16+. We have developed an ab initio simulation code that allows us to obtain accurate line profiles. It can reproduce experimental spectra with unprecedented accuracy. The quality of the profiles allows the direct determination of line width.

Original languageEnglish
Pages (from-to)132-149
Number of pages18
JournalRadiation Physics and Chemistry
Volume98
DOIs
Publication statusPublished - May 2014

    Fingerprint

Keywords

  • Double-crystal X-ray spectrometer
  • Electron-cyclotron resonance ion source
  • Highly charged ions

Cite this