Abstract
We have developed in the past a transient technique called Flying Spot Technique (FST)[1], based on the lateral photoeffect. It allows to determine the ambipolar diffusion length and the effective lifetime of the photogenerated carriers, once the light spot velocity and geometry of the structure are known. We propose to apply this technique backwards in order to detect the path and velocity of an object that is moving toward a light source direction. The light back reflected is analyzed by a p.i.n structure measuring the transient transverse photovoltage which is dependent on the object movement (position and velocity). Details concerning material characterization and device geometry will be presented.
| Original language | English |
|---|---|
| Pages (from-to) | 571-574 |
| Number of pages | 4 |
| Journal | Proceedings Of The Ieee |
| Volume | 1 |
| Publication status | Published - 1994 |
| Event | 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion/24th IEEE Photovoltaic Specialists Conference - Waikoloa, United States Duration: 5 Dec 1994 → 9 Dec 1994 |