A reconfigurable digital signal processing system for eddy currents non-destructive testing

Luís S. Rosado, Pedro M. Ramos, M. Piedade, Telmo G. Santos, Pedro Vilaça

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

18 Citations (Scopus)

Abstract

This paper presents a digital signal processing system specially designed for eddy currents non-destructive testing. This new system has a field programmable gate array based processing core, communication interfaces, data conversion and analog devices to interface the probes. Communication with personal computers is ensured by Ethernet 10/100 and universal serial bus 2.0 high speed interfaces. The proposed architecture enables to set several combinations of peripherals cards to generate or acquire probe signals. Also, the new system allows the digital generation and analysis of the probe signals through multiple digital signal processing algorithms. Two different peripheral cards have been developed to meet the needs for the new IOnic concept of eddy currents probe. The IOnic acquisition card is composed by a programmable gain amplifier and a high speed analog to digital converter. The current stimulus generation is achieved with a digital to analog converter and a high output current transconductance amplifier. Together, the two peripherals are able to operate the probe from 10 kHz up to 10 MHz. An additional peripheral card to interface stepper motors was designed for sensor positioning.

Original languageEnglish
Title of host publication2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings
Pages1284-1289
Number of pages6
DOIs
Publication statusPublished - 2010
Event2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Austin, TX, United States
Duration: 3 May 20106 May 2010

Conference

Conference2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010
Country/TerritoryUnited States
CityAustin, TX
Period3/05/106/05/10

Keywords

  • Digital signal processing
  • Eddy currents
  • FPGA
  • Non-destructive testing

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