A Model-oriented Methodology for the Automatic Parameter Extraction of TFT Model

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2 Citations (Scopus)

Abstract

The paper presents a model-driven methodology for the determination of thin-film transistors compact model parameters. The implementation of the proposed extraction methodology in python is presented. The validity of results obtained against devices characteristics is demonstrated. The advantage of the proposed methodology against a previously proposed approached is also discussed.

Original languageEnglish
Title of host publicationProceedings of 28th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2021
EditorsAndrzej Napieralski
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages27-30
Number of pages4
ISBN (Electronic)9788363578190
DOIs
Publication statusPublished - 24 Jun 2021
Event28th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2021 - Lodz, Poland
Duration: 24 Jun 202126 Jun 2021

Publication series

NameProceedings of 28th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2021

Conference

Conference28th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2021
Country/TerritoryPoland
CityLodz
Period24/06/2126/06/21

Keywords

  • Parameter Extraction
  • Thin Film Transistor

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