Abstract
The paper presents a model-driven methodology for the determination of thin-film transistors compact model parameters. The implementation of the proposed extraction methodology in python is presented. The validity of results obtained against devices characteristics is demonstrated. The advantage of the proposed methodology against a previously proposed approached is also discussed.
Original language | English |
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Title of host publication | Proceedings of 28th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2021 |
Editors | Andrzej Napieralski |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 27-30 |
Number of pages | 4 |
ISBN (Electronic) | 978-83-63578-19-0, 978-83-63578-20-6 |
ISBN (Print) | 978-1-6654-4348-7 |
DOIs | |
Publication status | Published - 24 Jun 2021 |
Event | 28th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2021 - Lodz, Poland Duration: 24 Jun 2021 → 26 Jun 2021 |
Conference
Conference | 28th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2021 |
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Country/Territory | Poland |
City | Lodz |
Period | 24/06/21 → 26/06/21 |
Keywords
- Parameter Extraction
- Thin Film Transistor