A model for the refractive index of amorphous silico for FDTD simulation of photonics waveguides

A. Fantoni, P. Lourenco, M. Vieira

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

This paper presents an analysis of the material quality influence for amorphous silicon waveguides for microphotonic applications. Material quality is taken into account by a model based on the absorption coefficient data obtained by Constant Photocurrent Measurement (CPM) in the near infrared region. The GUTL (Gauss-Urbach-Tauc-Lorentz) model has been presented as an extension of the standard Urbach-Tauc-Lorentz model and proposed as a predictor for the wavelength dependent optical constants of amorphous silicon in the near infrared spectra. Values produced for the GUTL model have been used as input for a set of FDTD simulations, taking in consideration different material qualities and waveguide dimensions directed to study the characteristics of amorphous silicon waveguides embedded in a SiO2 cladding.

Original languageEnglish
Title of host publication17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017
PublisherIEEE Computer Society
Pages167-168
Number of pages2
ISBN (Electronic)978-150905323-0
DOIs
Publication statusPublished - 11 Aug 2017
Event17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017 - Copenhagen, Denmark
Duration: 24 Jul 201728 Jul 2017

Conference

Conference17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017
CountryDenmark
CityCopenhagen
Period24/07/1728/07/17

Keywords

  • Amorphous silicon
  • Optical waveguides
  • Finite difference methods
  • Time-domain analysis

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    Fantoni, A., Lourenco, P., & Vieira, M. (2017). A model for the refractive index of amorphous silico for FDTD simulation of photonics waveguides. In 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017 (pp. 167-168). [8010044] IEEE Computer Society. https://doi.org/10.1109/NUSOD.2017.8010044