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Keyphrases
Ni-P
100%
Photodiode
60%
A-Si
56%
Image Sensor
38%
Photocurrent
28%
Doped Layers
28%
Amorphous Silicon
28%
Heterostructure
24%
Numerical Simulation
24%
Responsivity
19%
Visible Spectrum
19%
Output Characteristics
18%
Plasma-enhanced Chemical Vapor Deposition (PECVD)
17%
Spectral Response
17%
Heterojunction
17%
Applied Voltage
16%
Optical Bias
16%
Illumination Conditions
14%
Spectral Sensitivity
14%
Bias Conditions
14%
Photogeneration
13%
Spectral Response Measurement
13%
Sensing Element
13%
Sensor Output
12%
C-Si
12%
Image Recognition
12%
Device-independent
11%
Reverse Bias
11%
Electrical Bias
11%
Microcrystalline
11%
Optical Sensor
11%
Electrical Simulation
10%
Current-voltage Characteristics
10%
Color Separation
10%
Applied Bias
10%
Demultiplexing
10%
PIN Photodiode
10%
Electrical Model
10%
N-Si
10%
Light Bias
9%
Carrier Transport
9%
Hydrogenated Amorphous Silicon
9%
Color Image
8%
Optical Readout
8%
J-V Characteristics
8%
Physical Model
8%
Image Acquisition
8%
Voltage Control
8%
Low Temperature
8%
Optical Communications
8%
Engineering
Photodiode
66%
Image Sensor
44%
Photocurrent
42%
Spectral Response
38%
Heterojunctions
37%
Doped Layer
31%
Applied Voltage
20%
Heterostructures
20%
Electric Field
19%
Responsivity
19%
Sensor Output
15%
Bias Voltage
15%
Illumination Condition
15%
Transducer
14%
Physical Model
14%
Reverse Bias
13%
Chemical Vapor Deposition
13%
Collection Efficiency
13%
Band Gap
13%
Sensing Element
13%
Thin Films
12%
Microcrystalline
11%
Low-Temperature
11%
Image Recognition
11%
Current-Voltage Characteristic
11%
Experimental Result
10%
Optoelectronics
9%
Open Circuit Voltage
9%
Optical Sensors
9%
Vapor Deposition
9%
Channel Input
8%
Demultiplexing
8%
Two Dimensional
8%
Photonics
8%
Image Signal
8%
Plasmonics
8%
Color Image
8%
Hydrogenated Amorphous Silicon
7%
Photogenerated Carrier
7%
Signal-to-Noise Ratio
7%
Spatial Resolution
7%
Image Resolution
7%
Conductive
7%
SPICE
7%
Good Agreement
6%
Optical Sensor
6%
Transport Mechanism
6%
Intrinsic Layer
6%
Phototransistor
6%
Resistive
6%