Engineering & Materials Science
Zinc oxide
100%
Cellulose
83%
Oxide films
72%
Thin film transistors
64%
Substrates
63%
Transistors
58%
Thin films
56%
Oxides
55%
Semiconductor materials
53%
Temperature
46%
Electrolytes
43%
Metals
43%
Plasma enhanced chemical vapor deposition
42%
Indium
41%
Spectroscopic ellipsometry
40%
Gallium
40%
Gate dielectrics
38%
Amorphous silicon
38%
Oxide semiconductors
38%
Annealing
34%
Electronic equipment
33%
Electric properties
32%
Silicon
32%
Photodiodes
29%
Magnetron sputtering
28%
Field effect transistors
28%
Sputtering
27%
Cellulose nanocrystals
27%
Detectors
23%
Hydrogels
23%
Electrochromic devices
22%
Electrodes
22%
Electric potential
22%
Flexible electronics
21%
Hall mobility
21%
Sensors
20%
Optical properties
20%
Crystallization
20%
Nanoparticles
19%
Tin oxides
19%
Ink
19%
Optoelectronic devices
19%
ZnO nanoparticles
19%
Photocurrents
18%
Light polarization
18%
Hydrogen
18%
Plasmas
18%
Solar cells
17%
Carrier concentration
17%
Sodium
17%
Chemistry
Liquid Film
84%
Zinc Oxide
59%
Voltage
46%
Compound Mobility
44%
Amorphous Silicon
42%
Dielectric Material
41%
Semiconductor
39%
Oxide
38%
Application
35%
Ambient Reaction Temperature
35%
Field Effect
32%
Amorphous Material
30%
Plasma Enhanced Chemical Vapour Deposition
29%
Ellipsometry
26%
Magnetron Sputtering
26%
Annealing
25%
Electrical Property
24%
Transmittance
20%
Sputtering
19%
Ink
19%
Silicon Carbide
18%
Polycrystalline Solid
17%
Nanocrystal
15%
Optoelectronics
14%
Metal
14%
Behavior as Electrode
14%
Sintering
14%
Polarized Light
14%
Density of State
13%
Surface
13%
Photocurrent
13%
Time
13%
Nanomaterial
13%
Crystallization
13%
Hydrogen
12%
Schottky Barrier
12%
Plasma
12%
Sodium Atom
12%
Glass Substrate
12%
Optical Property
12%
Solar Cell
12%
Energy
11%
Hydrogel
11%
Conductivity
11%
Environmental Friendliness
10%
Zinc Oxide Nanoparticle
10%
Nanoparticle
10%
Solid Electrolyte
10%
Deposition Technique
9%
Carbon Fiber
9%
Physics & Astronomy
zinc oxides
59%
transistors
56%
thin films
48%
oxides
35%
cellulose
35%
MIS (semiconductors)
30%
ellipsometry
26%
room temperature
25%
performance
24%
indium oxides
22%
electrical properties
22%
silicon
20%
electronics
20%
photodiodes
18%
amorphous silicon
18%
sensors
17%
silicon films
17%
threshold voltage
16%
characterization
16%
annealing
14%
detectors
13%
magnetron sputtering
13%
oxide films
13%
gallium
13%
vapor deposition
12%
electrolytes
12%
sputtering
12%
silicon carbides
12%
crystallization
11%
metals
11%
saturation
10%
field effect transistors
10%
electric potential
10%
transmittance
9%
tin oxides
9%
oxygen
9%
solar cells
9%
polarized light
8%
glass
8%
hydrogen
8%
residual stress
8%
electrodes
8%
metal oxides
8%
nickel
8%
photocurrents
7%
hafnium oxides
7%
low voltage
7%
optical properties
7%
radio frequencies
7%
solid electrolytes
7%