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Personal profile

Personal information

Jonas Deuermeier holds a joint doctoral degree from the Universidade Nova de Lisboa, Portugal and the Technische Universität Darmstadt, Germany as a result of a collaborative PhD project under co-supervision by Prof. Elvira Fortunato and Prof. Andreas Klein. Currently, he is responsible for X-ray and ultravoilet photoelectron spectroscopy (XPS/UPS) at CENIMAT-I3N.

Research interests

Jonas Deuermeier has profound experience in X-ray photoelectron spectroscopy (XPS). His work in this field contributed to expand the possibilities of this powerful analytic tool by developing novel experimental approaches, such as the combination with parallel in situ electrical characterization and the usage of the Auger parameter for the determination of energy band alignments at the nanoscale.

The central theme of his research is the correlation of interface properties with electrical device behavior, with a strong emphasise on oxide semiconductors. Recently, his main output has been the development of novel self-rectifying resistive switching devices, which are controlled by chemical and electronic interactions at interfaces.

Education/Academic qualification

Nanotechnology and Nanosciences, Doctorate, Origins of limited electrical performance of polycrystalline Cu2O thin-film transistors, Technische Universität Darmstadt

Award Date: 9 Dec 2016


  • QC Physics
  • Oxide Semiconductors
  • Photoelectron Spectroscopy
  • Thin Film Devices


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